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The TOPFER Computer Power Supply Testing System Supports All-Round Power Supply Testing, Featuring Fast Testing Speed And High Accuracy

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    Buy cheap The TOPFER Computer Power Supply Testing System Supports All-Round Power Supply Testing, Featuring Fast Testing Speed And High Accuracy from wholesalers
     
    Buy cheap The TOPFER Computer Power Supply Testing System Supports All-Round Power Supply Testing, Featuring Fast Testing Speed And High Accuracy from wholesalers
    • Buy cheap The TOPFER Computer Power Supply Testing System Supports All-Round Power Supply Testing, Featuring Fast Testing Speed And High Accuracy from wholesalers

    The TOPFER Computer Power Supply Testing System Supports All-Round Power Supply Testing, Featuring Fast Testing Speed And High Accuracy

    Ask Lasest Price
    Brand Name : Topfer
    Model Number : Top-Smart 2000
    Price : to be discussed
    Payment Terms : T/T
    Supply Ability : 10 sets /30 days
    Delivery Time : 2 to 3 weeks
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    The TOPFER Computer Power Supply Testing System Supports All-Round Power Supply Testing, Featuring Fast Testing Speed And High Accuracy

    The TOPFER computer power supply testing system supports all-round power supply testing, featuring fast testing speed and high accuracy


    Features of the Top-Smart 2000 ATE Power Supply Testing System:


    Open

    • An open hardware platform that allows for the addition or removal of various testing devices according to customer needs (including devices with GPIB, RS-232, USB interfaces, etc.)

    • The ATE power supply testing system supports simultaneous testing of multiple single-group/multiple-group output power supplies, significantly increasing production line capacity.

    • An open software platform, the ATE power supply testing system can be expanded with new test items and functions based on customer testing requirements.

    • The ATE power supply testing system supports simultaneous multi-lane barcode pre-scanning and scanning during testing, enhancing overall testing speed.


    Universal

    • The ATE power supply testing system supports testing of various power supplies (LED power supplies, adapters/chargers, PC power supplies, inverters, communication power supplies, etc.)

    • Complies with ENERGY STAR and IEC 62301 measurement requirements.

    • Supports Manufacturing Information System (ShopFloor) interface.

    • The ATE power supply testing system supports testing of various power parameters under CV, CC, CR, LED modes.

    • Optimizes display mode, allowing for any combination of hardware configurations.


    High-Speed

    • The ATE power supply testing system supports simultaneous testing of multiple single-group/multiple-group output power supplies, significantly increasing production line capacity. (The testing speed for LED power supplies/adapters/chargers is more than double that of the widely used 6000 series power automatic systems.)

    • Conducts parallel barcode scanning during testing, greatly improving testing speed.


    More and more devices have been oriented towards automated testing, truly achieving automated product testing and humanized operation. When enterprises use the equipment, one person can operate multiple sets of tests, breaking the conventional manual testing rules. Such an automated testing production line not only reduces production costs, enhances production efficiency, and improves the quality of power supply products, but also features high precision. It is safe, environmentally friendly, time-saving, and significantly reduces labor intensity. It truly achieves low cost and high return, thereby enhancing the competitiveness of enterprises.


    Top-Smart 2000 ATE Power Supply Testing System Test Items:

    Test itemsComprehensive Test items
    CEC testShort circuit test
    DC Current under C.V.ModeShort circuit current
    Peak-Peak noiseOV protection
    Serial reaction time testUV protection
    Transient response timeOL protection
    Transient spikeOP protection
    TrackingIn-test adjustment test
    Voltage regulationAC cycle drop out
    Current regulationPLD simulation
    Turn ON timeDC output current test
    Rise timeDC output voltage test
    Fall timeWaveform read test
    Hold-up timeInput impulse current test
    Inrush current testInput power
    Power good signalRelay control
    Power fail signalBar code scan
    P/S ON signalDynamic test
    Power up sequenceSpecification under C.P.Mode
    Power off sequenceInput Peak current
    Effciency testAdditional expansion measurement test
    Overall stability testInput RMS current
    Fan Speed testTTL signal control
    Input power factorLAN read/write
    Input voltage rampRS485 read/write
    Input freq. rampUSB read/write
    Extend the measurement test232 read/write
    Automatic testGPIB read/write

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